8 通道 Denoising-First Attention-Residual Network

正式 10 位正常人、Left vs Right、outer 5-fold;主分析 20+20 trials,另列 all-trial 容量上限。

結論摘要

20+20 最佳模式為 ShallowConvNet scratch,跨受試者平均 58.00% ± 7.83%

Staged joint fine-tune 在 20+20 為 55.94%,比 matched Shallow 低 2.06%;all-trial 為 66.54%,仍低於 Shallow 的 67.94%。本實驗未達成相對 Shallow +3 pp、CI 下界高於 0 或至少 7/10 人改善的成功標準。

去噪器先以 30 位連續 EEG 選擇訓練步數,再用全部 34 位重訓;正式 10 位及 outer test 均未參與預訓練或 checkpoint 選擇。

結果判讀

去噪器保留了大部分 MI 頻帶結構:Mu/Beta power correlation 為 0.9954,C3/C4 covariance correlation 為 0.9931,側化方向保持率為 95.66%。然而,未污染輸入的 residual RMS 為 0.135 SD,超過 0.10 SD 安全門檻;固定合成污染的 waveform MSE 也由 0.0440 上升至 0.0602(+0.0162)。因此本版屬於保留頻帶大方向、但存在過度修正且未真正降低污染誤差,不能宣稱去噪有效,分類負結果與此診斷一致。

all-trial 明顯高於 20+20,表示這個資料集的主要限制仍較像個人化標記 trial 數量與 subject-specific variability,而不是單純增加模型容量即可解決。

20+20 主結果

mode n_subjects mean_accuracy std_accuracy mean_balanced_accuracy mean_macro_f1 corrupted_accuracy
Attention-Residual scratch 10 54.90% 4.97% 54.87% 46.48% 54.45%
Frozen denoiser + classifier 10 54.41% 5.55% 54.47% 46.00% 53.68%
Staged joint fine-tune 10 55.94% 6.44% 55.94% 50.67% 55.44%
ShallowConvNet scratch 10 58.00% 7.83% 58.01% 52.68% 57.47%

20x20 group

20x20 subjects

相對 Shallow 的配對檢定

mode reference mean_difference bootstrap_ci_low bootstrap_ci_high wilcoxon_p subjects_improved n_subjects
Attention-Residual scratch shallow_scratch -3.11% -7.49% 0.41% 0.232422 4 10
Frozen denoiser + classifier shallow_scratch -3.59% -8.41% 1.06% 0.160156 2 10
Staged joint fine-tune shallow_scratch -2.06% -5.74% 1.27% 0.275391 4 10

統計單位是受試者,bootstrap 95% CI 與 Wilcoxon 均由 subject-level mean accuracy 計算。

All-trial 容量上限

mode n_subjects mean_accuracy std_accuracy mean_balanced_accuracy mean_macro_f1 corrupted_accuracy
Attention-Residual scratch 10 66.66% 12.27% 66.65% 65.27% 66.17%
Frozen denoiser + classifier 10 65.71% 13.10% 65.68% 63.19% 64.66%
Staged joint fine-tune 10 66.54% 12.92% 66.53% 64.97% 65.81%
ShallowConvNet scratch 10 67.94% 14.59% 67.96% 65.39% 65.60%

all group

all subjects

去噪安全檢查

Check Value Criterion Pass
Identity residual RMS 0.135087 < 0.10 SD False
Mu/Beta power correlation 0.995448 > 0.95 True
C3-C4 lateral direction 0.956551 > 95% True
Corrupted MSE before 0.043999 diagnostic
Corrupted MSE after 0.060218 lower is better False

denoising waveform and psd

流程

1–40 Hz zero-phase SOS IIR → 200 Hz → 0–2 s → trial/channel Z-score。分類訓練增強僅有 0.95–1.05 振幅、每通道小量 DC 與 ±50 ms shift。未使用 ASR、ICA、EA、Rest 或 pseudo-clean teacher。